Thickness dependence on the dielectric properties of BaTiO 3/SrTiO3-multilayers

Thin Solid Films

Volumn 449, Issue 1-2, 2004, Pages 80-85

  Koebernik, G ^a   Haessler, W ^a   Pantou, R ^b   Weiss, F ^b  

^a IFW DRESDEN   (Germany)

^b GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

Author keywords

Epitaxy; Ferroelectric properties; Laser ablation; Superlattices

Indexed keywords

BARIUM COMPOUNDS; DIELECTRIC PROPERTIES OF SOLIDS; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; LASER ABLATION; PULSED LASER DEPOSITION; SINGLE CRYSTALS; SOLID SOLUTIONS; STRONTIUM COMPOUNDS; STRUCTURE (COMPOSITION); SUPERLATTICES; THERMAL EFFECTS; THICKNESS MEASUREMENT; THIN FILMS;

CURIE TEMPERATURE; TEMPERATURE DEPENDENCE;

MULTILAYERS;

EID: 1042281125     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.031     Document Type: Article

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