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Volumn 42, Issue 3, 2004, Pages 559-563

Observation of single-walled carbon nanotubes by photoemission microscopy

Author keywords

A. Carbon nanotubes; B. Chemical vapor deposition; C. X ray photoelectron spectroscopy; D. Electronic properties

Indexed keywords

CATALYSIS; CATALYSTS; CHEMICAL VAPOR DEPOSITION; DOPING (ADDITIVES); ELECTRONIC PROPERTIES; FIELD EFFECT TRANSISTORS; IRON; PHOTOEMISSION; SCANNING ELECTRON MICROSCOPY; SILICA; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 1042265864     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2003.12.056     Document Type: Article
Times cited : (9)

References (19)
  • 1
    • 79956033651 scopus 로고    scopus 로고
    • Growth of suspended carbon nanotube networks on 100-nm-scale silicon pillars
    • Homma Y., Kobayashi Y., Ogino T., Yamashita T. Growth of suspended carbon nanotube networks on 100-nm-scale silicon pillars. Appl. Phys. Lett. 81(12):2002;2261-2263.
    • (2002) Appl. Phys. Lett. , vol.81 , Issue.12 , pp. 2261-2263
    • Homma, Y.1    Kobayashi, Y.2    Ogino, T.3    Yamashita, T.4
  • 2
    • 0034248906 scopus 로고    scopus 로고
    • Formation of low-resistance ohmic contacts between carbon nanotube and metal electrodes by a rapid thermal annealing method
    • Lee J.-O., Park C., Kim J.-J., Kim J., Park J.W., Yoo K.-H. Formation of low-resistance ohmic contacts between carbon nanotube and metal electrodes by a rapid thermal annealing method. J. Phys. D. 33(16):2000;1953-1956.
    • (2000) J. Phys. D , vol.33 , Issue.16 , pp. 1953-1956
    • Lee, J.-O.1    Park, C.2    Kim, J.-J.3    Kim, J.4    Park, J.W.5    Yoo, K.-H.6
  • 4
    • 0041445527 scopus 로고    scopus 로고
    • Novel length scale in nanotube devices
    • Leonard F., Tersoff J. Novel length scale in nanotube devices. Phys. Rev. Lett. 83(24):1999;5174-5177.
    • (1999) Phys. Rev. Lett. , vol.83 , Issue.24 , pp. 5174-5177
    • Leonard, F.1    Tersoff, J.2
  • 5
    • 0041947020 scopus 로고    scopus 로고
    • Role of Fermi-level pinning in nanotube Schottky diodes
    • Leonard F., Tersoff J. Role of Fermi-level pinning in nanotube Schottky diodes. Phys. Rev. Lett. 84(20):2000;4693-4696.
    • (2000) Phys. Rev. Lett. , vol.84 , Issue.20 , pp. 4693-4696
    • Leonard, F.1    Tersoff, J.2
  • 6
    • 0003011430 scopus 로고    scopus 로고
    • ESCA microscopy at ELETTRA: What it is like to perform spectromicroscopy experiments on a third generation synchrotron radiation source
    • Marsi M., Casalis L., Gregoratti L., Gunther S., Kolmakov A., Kovac J., et al. ESCA microscopy at ELETTRA: what it is like to perform spectromicroscopy experiments on a third generation synchrotron radiation source. J. Electron Spectrosc. Relat. Phenom. 84:1997;73-83.
    • (1997) J. Electron Spectrosc. Relat. Phenom. , vol.84 , pp. 73-83
    • Marsi, M.1    Casalis, L.2    Gregoratti, L.3    Gunther, S.4    Kolmakov, A.5    Kovac, J.6
  • 7
    • 0000562862 scopus 로고    scopus 로고
    • Synchrotron radiation scanning photoemission microscopy: Instrumentation and application in surface science
    • Kiskinova M., Marsi M., Di Fabrizio E., Gentili M. Synchrotron radiation scanning photoemission microscopy: Instrumentation and application in surface science. Surf. Rev. Lett. 6(2):1999;265-286.
    • (1999) Surf. Rev. Lett. , vol.6 , Issue.2 , pp. 265-286
    • Kiskinova, M.1    Marsi, M.2    Di Fabrizio, E.3    Gentili, M.4
  • 8
    • 79956031313 scopus 로고    scopus 로고
    • Cross sectional studies of buried semiconductor interfaces by means of photoemission microscopy
    • Barbo F., Bertolo M., Bianco A., Cautero G., Fontana S., Johal T.K., et al. Cross sectional studies of buried semiconductor interfaces by means of photoemission microscopy. Appl. Phys. Lett. 80(14):2002;2511-2513.
    • (2002) Appl. Phys. Lett. , vol.80 , Issue.14 , pp. 2511-2513
    • Barbo, F.1    Bertolo, M.2    Bianco, A.3    Cautero, G.4    Fontana, S.5    Johal, T.K.6
  • 9
    • 4243326640 scopus 로고    scopus 로고
    • Electronic structure of carbon nanotubes studied by photoelectron spectromicroscopy
    • Suzuki S., Watanabe Y., Ogino T., Heun S., Gregoratti L., Barinov A., et al. Electronic structure of carbon nanotubes studied by photoelectron spectromicroscopy. Phys. Rev. B. 66(3):2002;035414-1-4.
    • (2002) Phys. Rev. B , vol.66 , Issue.3 , pp. 0354141-0354144
    • Suzuki, S.1    Watanabe, Y.2    Ogino, T.3    Heun, S.4    Gregoratti, L.5    Barinov, A.6
  • 10
    • 0037115510 scopus 로고    scopus 로고
    • Extremely small diffusion constant of Cs in multiwalled carbon nanotubes
    • Suzuki S., Watanabe Y., Ogino T., Heun S., Gregoratti L., Barinov A., et al. Extremely small diffusion constant of Cs in multiwalled carbon nanotubes. J. Appl. Phys. 92(12):2002;7527-7531.
    • (2002) J. Appl. Phys. , vol.92 , Issue.12 , pp. 7527-7531
    • Suzuki, S.1    Watanabe, Y.2    Ogino, T.3    Heun, S.4    Gregoratti, L.5    Barinov, A.6
  • 11
    • 0037175797 scopus 로고    scopus 로고
    • Electronic structure of the carbon nanotube tips studied by X-ray-absorption spectroscopy and scanning photoelectron microscopy
    • Chiou J.W., Yueh C.L., Jan J.C., Tsai H.M., Pong W.F., Hong I.-H., et al. Electronic structure of the carbon nanotube tips studied by X-ray-absorption spectroscopy and scanning photoelectron microscopy. Appl. Phys. Lett. 81(22):2002;4189-4191.
    • (2002) Appl. Phys. Lett. , vol.81 , Issue.22 , pp. 4189-4191
    • Chiou, J.W.1    Yueh, C.L.2    Jan, J.C.3    Tsai, H.M.4    Pong, W.F.5    Hong, I.-H.6
  • 12
    • 0001704931 scopus 로고    scopus 로고
    • Electrical Transport Through Single-Wall Carbon Nanotubes
    • M.S. Dresselhaus, G. Dresselhaus, & Ph. Avouris. New York: Springer
    • Yao Z., Dekker C., Avouris Ph. Electrical Transport Through Single-Wall Carbon Nanotubes. Dresselhaus M.S., Dresselhaus G., Avouris Ph. Carbon Nanotubes-Synthesis, Structure, Properties, and Applications. 2001;147-171 Springer, New York.
    • (2001) Carbon Nanotubes-synthesis, Structure, Properties, and Applications , pp. 147-171
    • Yao, Z.1    Dekker, C.2    Avouris, Ph.3
  • 14
    • 0036462906 scopus 로고    scopus 로고
    • Effects of air exposure and Cs deposition on the electronic structure of multiwalled carbon nanotubes
    • Suzuki S., Watanabe Y., Kiyokura T., Nath K.G., Ogino T., Heun S., et al. Effects of air exposure and Cs deposition on the electronic structure of multiwalled carbon nanotubes. Surf. Rev. Lett. 9(1):2002;431-435.
    • (2002) Surf. Rev. Lett. , vol.9 , Issue.1 , pp. 431-435
    • Suzuki, S.1    Watanabe, Y.2    Kiyokura, T.3    Nath, K.G.4    Ogino, T.5    Heun, S.6
  • 15
    • 0032492884 scopus 로고    scopus 로고
    • Room-temperature transistor based on a single carbon nanotube
    • Tans S.J., Verschueren A.R.M., Dekker C. Room-temperature transistor based on a single carbon nanotube. Nature. 393(6680):1998;49-52.
    • (1998) Nature , vol.393 , Issue.6680 , pp. 49-52
    • Tans, S.J.1    Verschueren, A.R.M.2    Dekker, C.3
  • 16
    • 0035851465 scopus 로고    scopus 로고
    • Controlled creation of a carbon nanotube diode by a scanning gate
    • Freitag M., Radosavljevic M., Zhou Y., Johnson A.T. Controlled creation of a carbon nanotube diode by a scanning gate. Appl. Phys. Lett. 79(20):2001;3326-3328.
    • (2001) Appl. Phys. Lett. , vol.79 , Issue.20 , pp. 3326-3328
    • Freitag, M.1    Radosavljevic, M.2    Zhou, Y.3    Johnson, A.T.4
  • 17
    • 0001268985 scopus 로고    scopus 로고
    • Work functions and valence band states of pristine and Cs-intercalated single-walled carbon nanotube bundles
    • Suzuki S., Bower C., Watanabe Y., Zhou O. Work functions and valence band states of pristine and Cs-intercalated single-walled carbon nanotube bundles. Appl. Phys. Lett. 76(26):2000;4007-4009.
    • (2000) Appl. Phys. Lett. , vol.76 , Issue.26 , pp. 4007-4009
    • Suzuki, S.1    Bower, C.2    Watanabe, Y.3    Zhou, O.4
  • 18
    • 0038556747 scopus 로고    scopus 로고
    • Electronic structure of single-walled carbon nanotubes encapsulating potassium
    • Suzuki S., Maeda F., Watanabe Y., Ogino T. Electronic structure of single-walled carbon nanotubes encapsulating potassium. Phys. Rev. B. 67(11):2003;115418-1-6.
    • (2003) Phys. Rev. B , vol.67 , Issue.11 , pp. 1154181-1154186
    • Suzuki, S.1    Maeda, F.2    Watanabe, Y.3    Ogino, T.4
  • 19
    • 0017556846 scopus 로고
    • The work function of the elements and its periodicity
    • Michaelson H.B. The work function of the elements and its periodicity. J. Appl. Phys. 48(11):1977;4729-4733.
    • (1977) J. Appl. Phys. , vol.48 , Issue.11 , pp. 4729-4733
    • Michaelson, H.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.