Formation of low-resistance ohmic contacts between carbon nanotube and metal electrodes by a rapid thermal annealing method

Journal of Physics D: Applied Physics

Volumn 33, Issue 16, 2000, Pages 1953-1956

  Lee, Jeong O ^a   Park, C ^a   Kim, Ju Jin ^a   Kim, Jinhee ^b   Park, Jong Wan ^b   Yoo, Kyung Hwa ^b  

^a Chonbuk National University   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; ELECTRODES; ENERGY GAP; GOLD; NANOTUBES; OPTICAL MICROSCOPY; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; TITANIUM;

CONTACT RESISTANCE; LOW RESISTANCE OHMIC CONTACTS; LOW TEMPERATURE ANNEALING;

OHMIC CONTACTS;

EID: 0034248906     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/16/303     Document Type: Article

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