Effects of three-dimensional atomic forces in topographical imaging of atoms with an atom force microscope

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 24, 2003, Pages

  Wang, Wei Li ^a   Hu, S Jack ^a   Clarke, Roy ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHITE;

ARTICLE; ATOM; ATOMIC FORCE MICROSCOPY; CALCULATION; FORCE; FRICTION; IMAGE ANALYSIS; IMAGING SYSTEM; MATHEMATICAL ANALYSIS; MODEL; OPTICS; STRUCTURE ANALYSIS;

EID: 1042263367     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.245401     Document Type: Article

References (33)

1. G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
2. G. Binnig, Ch. Gerber, E. Stoll, T. R. Albrecht, and C. F. Quate, Europhys. Lett. 3, 1281 (1987).
3. O. Marti, B. Drake, and P. K. Hansma, Appl. Phys. Lett. 51, 484 (1987).
4. G. Meyer and N. M. Amer, Appl. Phys. Lett. 56, 2100 (1990).
5. G. Meyer and N. M. Amer, Appl. Phys. Lett. 57, 2089 (1990).
6. J. Ruan and B. Bhushan, J. Appl. Phys. 76, 5022 (1994).
7. G. Binnig, Ultramicroscopy 42–44, 7 (1992).
8. C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. 59, 1942 (1987).
9. S. Fujisawa, Y. Sugawara, S. Ito, S. Mishima, T. Okada, and S. Morita, Nanotechnology 4, 138 (1993).
10. S. Fujisawa, E. Kishi, Y. Sugawara, and S. Morita, Phys. Rev. B 51, 7849 (1995).
11. S. Fujisawa, K. Yokoyama, Y. Sugawara, and S. Morita, Phys. Rev. B 58, 4909 (1998).
12. H. Hölscher, U. D. Schwarz, O. Zwörner, and R. Wiesendanger, Phys. Rev. B 57, 2477 (1998).
13. N. Sasaki, K. Kobayashi, and M. Tsukada, Phys. Rev. B 54, 2138 (1996).
14. J. Shimizu, H. Eda, M. Yoritsune, and E. Ohmura, Nanotechnology 9, 118 (1998).
15. H. Hölscher, U. D. Schwarz, and R. Wiesendanger, Surf. Sci. 375, 395 (1997).
16. A. J. den Boef, Rev. Sci. Instrum. 62, 88 (1990).
17. M. Radmacher, R. W. Tillmann, M. Fritz, and H. E. Gaub, Science 257, 1900 (1992).
18. R. J. Warmack, X.-Y. Zheng, T. Thundat, and D. P. Allison, Rev. Sci. Instrum. 65, 394 (1994).
19. A. Selloni, P. Carnevali, E. Tosatti, and C. D. Chen, Phys. Rev. B 31, 2602 (1985).
20. W. E. Carlos and M. W. Cole, Surf. Sci. 91, 339 (1980).
21. H. A. Mizes, S. I. Park, and W. A. Harrison, Phys. Rev. B 36, 4491 (1987).
22. S. A. C. Gould, K. Burke, and P. K. Hansma, Phys. Rev. B 40, 5363 (1989).
23. F. F. Abraham and I. P. Batra, Surf. Sci. 209, L125 (1989).
24. I. P. Batra and S. Ciraci, J. Vac. Sci. Technol. A 6, 313 (1988).
25. L. Xu, X. W. Yao, L. P. Zhang, M. Q. Li, and F. J. Yang, Phys. Rev. B 51, 10 013 (1995).
26. M. Tosa, Adv. Colloid Interface Sci. 71–72, 233 (1997).
27. W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger, Appl. Surf. Sci. 140, 247 (1999).
28. MutiMode SPM, Digital Instruments, Santa Barbara, CA.
29. S. Park and C. F. Quate, Appl. Phys. Lett. 48, 112 (1986).
30. G. Binnig, H. Fuchs, Ch. Gerber, H. Rohrer, E. Stoll, and E. Tosatti, Europhys. Lett. 1, 31 (1986).
31. H. J. Mamin, E. Ganz, D. W. Abraham, R. E. Thomson, and J. Clarke, Phys. Rev. B 34, 9015 (1986).
32. D. Tomanek, S. G. Louie, H. J. Mamin, D. W. Abraham, R. E. Thomson, E. Ganz, and J. Clarke, Phys. Rev. B 35, 7790 (1987).
33. T. R. Albrecht and C. F. Quate, J. Appl. Phys. 62, 2599 (1987).