Measurement of atomic forces between surface atoms using an ultra-clean AFM incorporated in an XHV integrated system

Advances in Colloid and Interface Science

Volumn 71-72, Issue , 1997, Pages 233-241

  Tosa, Masahiro ^a  

^a Japan Science and Technology Agency   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; FORCE MEASUREMENT; FRICTION; GRAPHITE; SURFACES; VACUUM APPLICATIONS;

EXTREME HIGH VACUUM (XHV) INTEGRATED SYSTEM; HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG);

ATOMIC PHYSICS;

EID: 0031222166     PISSN: 00018686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0001-8686(97)00019-5     Document Type: Article

References (8)