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Volumn 375, Issue 2-3, 1997, Pages 395-402
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Modelling of the scan process in lateral force microscopy
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Author keywords
Atomic force microscopy; Friction; Tribology
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Indexed keywords
COMPUTER SIMULATION;
EQUATIONS OF MOTION;
FRICTION;
MOLYBDENUM COMPOUNDS;
SURFACES;
TRIBOLOGY;
LATERAL FORCE MICROSCOPY;
MOLYBDENUM SULFIDE;
SCANNING FORCE MICROSCOPY;
STICK SLIP BEHAVIOR;
TIP SAMPLE INTERACTIONS;
ATOMIC FORCE MICROSCOPY;
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EID: 0031125412
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(96)01285-X Document Type: Article |
Times cited : (88)
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References (29)
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