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Volumn 375, Issue 2-3, 1997, Pages 395-402

Modelling of the scan process in lateral force microscopy

Author keywords

Atomic force microscopy; Friction; Tribology

Indexed keywords

COMPUTER SIMULATION; EQUATIONS OF MOTION; FRICTION; MOLYBDENUM COMPOUNDS; SURFACES; TRIBOLOGY;

EID: 0031125412     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01285-X     Document Type: Article
Times cited : (88)

References (29)
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    • For recent reviews on the new experimental tools for nanotribology and some representative results, see also J. Krim, Comments Condens. Mater. Phys. 17 (1995) 263; B. Bhushan, J.N. Israelachvili and U. Landman, Nature 374 (1995) 607.
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    • McClelland, G.M.1
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    • Eds. R. Wiesendanger and H.-J. Güntherodt Springer, Berlin
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    • The physics of sliding friction
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    • U.D. Schwarz, H. Bluhm, H. Hölscher, W. Allers and R. Wiesendanger, in: The Physics of Sliding Friction, Eds. B.N.J. Persson and E. Tosatti, NATO ASI Series E, Vol. 311 (Kluwer, Dordrecht, 1996) p. 389.
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    • Forces in scanning probe methods
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    • Micro/Nanotribology and its applications
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.