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Volumn , Issue , 2003, Pages

Morphing, self-repairing engines: A vision for the intelligent engine of the future

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL SYSTEMS; MACHINE DESIGN; REPAIR; SIGNAL PROCESSING;

EID: 10244269879     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (24)

References (14)
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  • 2
    • 84886358170 scopus 로고    scopus 로고
    • Optical Techniques for Propulsion System Measurements
    • Presented at the, Huntsville, AL, May 13-15
    • Oberle, L.; "Optical Techniques for Propulsion System Measurements", Presented at the Propulsion Measurement Sensor Development Workshop, Huntsville, AL, May 13-15, 2003.
    • (2003) Propulsion Measurement Sensor Development Workshop
    • Oberle, L.1
  • 3
    • 32044437919 scopus 로고    scopus 로고
    • Experiment and Modeling of a Rocket Engine Heat Flux Environment for Materials Testing
    • AIAA 2003-0283
    • Dickens, KW; Linne, DL; and Georgiadis, N.J.; "Experiment and Modeling of a Rocket Engine Heat Flux Environment for Materials Testing", 41st Annual Aerospace Sciences Meeting, AIAA 2003-0283, 2003.
    • (2003) 41st Annual Aerospace Sciences Meeting
    • Dickens, K.W.1    Linne, D.L.2    Georgiadis, N.J.3
  • 4
    • 0001914210 scopus 로고    scopus 로고
    • Deep RIE Process for Silicon Carbide Power Electronics and MEMS
    • Shul, R. J.; Ren, F.; Murakami, M.; and Pletschen, W.; Eds. Warrandale, PA: Materials Research Society
    • Beheim G. M.; and Salupo, C. S.; "Deep RIE Process for Silicon Carbide Power Electronics and MEMS" Wide-Bandgap Electronic Devices, Shul, R. J.; Ren, F.; Murakami, M.; and Pletschen, W.; Eds. Warrandale, PA: Materials Research Society, 2000.
    • (2000) Wide-Bandgap Electronic Devices
    • Beheim, G.M.1    Salupo, C.S.2
  • 6
    • 84973623309 scopus 로고    scopus 로고
    • Advances in Thin Film Sensor Technologies for Engine Applications
    • NASA TM-107418, Orlando, FL, June 2-5
    • Lei, J.F.; Martin, L.C.; and Will, H.A.; "Advances in Thin Film Sensor Technologies for Engine Applications," NASA TM-107418, Turbo Expo'97, Orlando, FL, June 2-5, 1997.
    • (1997) Turbo Expo'97
    • Lei, J.F.1    Martin, L.C.2    Will, H.A.3
  • 8
    • 84896364639 scopus 로고    scopus 로고
    • CRC Press LLC, ed. M. Gad-el-Hak, Ch. 22
    • Hunter, G.W.; Liu, C.C.; and Makel, D.; CRC Press LLC, ed. M. Gad-el-Hak, Ch. 22, 2001.
    • (2001)
    • Hunter, G.W.1    Liu, C.C.2    Makel, D.3
  • 11
    • 0031484703 scopus 로고    scopus 로고
    • Processed-Induced Morphological Defects in Epitaxial CVD Silicon Carbide
    • Powell, J. A. and Larkin, D. J.; "Processed-Induced Morphological Defects in Epitaxial CVD Silicon Carbide", Physica Status Solidi (b), 202, pp. 529-548, 1997.
    • (1997) Physica Status Solidi , vol.202 , Issue.b , pp. 529-548
    • Powell, J.A.1    Larkin, D.J.2
  • 12
    • 0003684350 scopus 로고    scopus 로고
    • 600 °C Logic Gates Using Silicon Carbide JFET's
    • March 20-23, Anaheim, CA
    • Neudeck P.G.; "600 °C Logic Gates Using Silicon Carbide JFET's", Government Microcircuit Applications Conference, March 20-23, Anaheim, CA., pp. 421-424, 2000.
    • (2000) Government Microcircuit Applications Conference , pp. 421-424
    • Neudeck, P.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.