Wavelet transform for evaluation of semiconductor laser reliability

Zhongguo Jiguang/Chinese Journal of Lasers

Volumn 31, Issue 9, 2004, Pages 1050-1054

  Lin, Hu ^a   Guo, Shu Xu ^a   Zhao, Wei ^b   Zhang, Su Mei ^a   Shi, Jia Wei ^a  

^a JILIN UNIVERSITY   (China)

^b NORTHEAST NORMAL UNIVERSITY   (China)

Author keywords

Laser technique; Reliability; Semiconductor laser; Singularity detection; Wavelet transform

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; RELIABILITY; WAVELET TRANSFORMS;

RELIABILITY EVALUATION; SINGULARITY DETECTION PRINCIPLE; THRESHOLD CURRENT;

SEMICONDUCTOR LASERS;

EID: 10044297324     PISSN: 02587025     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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