Application of the electrical derivative measurement in rapid screening of high-power semiconductor lasers

Zhongguo Jiguang/Chinese Journal of Lasers

Volumn 26, Issue 6, 1999, Pages 507-510

  Li, Hongyan ^a   Shi, Jiawei ^a   Jin, Enshun ^a   Qi, Liyun ^a   Li, Zhengting ^a   Gao, Dingsan ^a   Xiao, Jianwei ^a   Liu, Zhongshun ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH POWER LASERS; LASER ACCESSORIES; QUALITY CONTROL; RELIABILITY; SEMICONDUCTOR LASERS;

ELECTRICAL DERIVATIVE CURE; OXIDE STRIPE STRUCTURE;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0033140709     PISSN: 02587025     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)