Process-based real-time scene data processor design for emitter array infrared projectors

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4717, Issue , 2002, Pages 120-135

  Williams, Owen M ^a   Świerkowski, Leszek ^a   Thompson, Rhoe A ^b   Goldsmith II, George C ^b   Larry Herald, W ^c  

^a DEFENCE SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c MacAulay Brown Inc   (Australia)

Author keywords

Dynamic infrared scene projection; Nonuniformity correction; Real time processing

Indexed keywords

COMPUTER SIMULATION; DIGITAL TO ANALOG CONVERSION; ELECTRIC POTENTIAL; INFRARED RADIATION;

REAL-TIME NONUNIFORMITY CORRECTION PROCESSORS;

OPTICAL PROJECTORS;

EID: 0036029716     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.474713     Document Type: Article

References (12)

1. A.P. Pritchard, S.P. Lake, I.M. Sturland, M.D. Balmond and D.W. Gough, "Performance characteristics of a 256 × 256 suspended resistor infrared scene generator system," in Characterization, Propagation, and Simulation of Sources and Backgrounds IV, Proc. SPIE Vol. 2223, 16-25 (1994).
2. R.G. Stockbridge, G.C. Goldsmith II, A.G. Guertin, "Characterization and nonuniformity correction of a resistor array infrared projector," in Characterization, Propagation, and Simulation of Sources and Backgrounds IV, Proc. SPIE Vol. 2223, 51-62 (1994).
3. L.E. Jones, E.M. Olson, R.L. Murrer Jr. and A.R. Andrews, "A simplified method for the hardware implementation of nonuniformity correction on a resistor array infrared scene projector," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing II, Proc. SPIE Vol. 3084, 139-150 (1997).
4. E.M. Olson, O.M. Williams and R.A. Thompson, "Optimization of resistor array infrared projector temporal response," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VI, Proc. SPIE Vol. 4366, 475-488 (2001).
5. A.P. Pritchard, M.A. Venables, S.P. Lake and D.W. Gough, "Refinements in practical accuracy factors for resistor array IR scene projectors," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing III, Proc. SPIE Vol. 3368, 237-244 (1998).
6. E.M. Olson and R.L. Murrer Jr., "Non-uniformity correction of a resistor array infrared scene projector," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE Vol. 3697, 403-413 (1999).
7. C. Malone and D. Flynn, "Optimization of measurement process variables used in radiance uniformity calibration of the emitter source for the Wide Band Infrared scene Projector (WISP)," in Targets and Backgrounds: Characterization and Representation, Proc. SPIE Vol. 2469, 118-131 (1995).
8. B. Cole, R. Higashi, J. Ridley, J. Holmen, R. Stockbridge, L. Murrer and E. Burroughs, "Large-area infrared microemitter arrays for dynamic infrared scene projection," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing III, Proc. SPIE Vol. 3368, 57-70 (1998).
9. O.M. Williams, "Evaluation of emissive infrared projector radiant output parameters," in Characterization, Propagation, and Simulation of Sources and Backgrounds II, Proc. SPIE Vol. 1687, 402-414 (1992).
10. O.M. Williams, "Infrared photodetector background current estimation," Applied Optics 31, 497-503 (1992).
11. O.M. Williams, "Infrared projector effective blackbody temperature," Opt. Eng. 33, 230-236 (1994).
12. "Imaging infrared projector design," (O.M. Williams, ed.), The Technical Cooperation Program, TTCP/WTP-5/KTA-18 final report, November 1995, 197pp.