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Volumn , Issue , 2004, Pages 8-12

Fast error-correcting circuits for fault-tolerant memory

Author keywords

[No Author keywords available]

Indexed keywords

ERROR-CORRECTING CIRCUITS; FAULT-TOLERANT MEMORY; PRODUCTION COST; SEMICONDUCTOR MEMORY;

EID: 10044243787     PISSN: 10874852     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.2004.1327977     Document Type: Conference Paper
Times cited : (7)

References (18)
  • 2
    • 0004038844 scopus 로고    scopus 로고
    • Boston, Mass.: Kluwer Academic Publishers
    • Cappelletti, et al, ed. Flash Memories. Boston, Mass.: Kluwer Academic Publishers, 1999.
    • (1999) Flash Memories
    • Cappelletti1
  • 4
    • 0024627110 scopus 로고
    • Degradation due to hole trapping in flash memory cells
    • Haddad, et al. Degradation due to hole trapping in Flash memory cells. IEEE Electron Device Letters, 117-119, 10, 3, 1989.
    • (1989) IEEE Electron Device Letters , vol.10 , Issue.3 , pp. 117119
    • Haddad1
  • 5
    • 10044243716 scopus 로고    scopus 로고
    • Embedded DRAM: Combining memory expertise
    • IBM Technology Group Library
    • IBM Microelectronics. Embedded DRAM: Combining memory expertise, ASIC methodology, and base technology. IBM Technology Group Library, 2002.
    • (2002) ASIC Methodology, and Base Technology
  • 9
    • 0029307098 scopus 로고
    • Investigation of the soft-write mechanism in source side injection flash EEPROM devices
    • Van Houdt et al. Investigation of the soft-write mechanism in source side injection flash EEPROM devices. IEEE Electron Device Letters, 181, 16, 1995.
    • (1995) IEEE Electron Device Letters , vol.16 , pp. 181
    • Van Houdt1
  • 10
    • 0023829362 scopus 로고
    • Reliability performance of ETOX based flash memories
    • G. Verma and N. Mielke. Reliability performance of ETOX based Flash memories. Proc. IEEE IRPS, 158-166, 1988.
    • (1988) Proc. IEEE IRPS , pp. 158-166
    • Verma, G.1    Mielke, N.2
  • 12
    • 0031096505 scopus 로고    scopus 로고
    • Near Shannon limit performance of low density parity check codes
    • D.Mackay and R.Neal. Near Shannon limit performance of low density parity check codes. IEEE Electronics Letters, 33, 6, 1997.
    • (1997) IEEE Electronics Letters , vol.33 , Issue.6
    • Mackay, D.1    Neal, R.2
  • 16
    • 0031146351 scopus 로고    scopus 로고
    • A compact on-chip ECC for low cost flash memories
    • Tanzawa et al. A Compact On-Chip ECC for Low Cost Flash Memories. IEEE Journal of Solid-State Circuits, 22, 5, 1997.
    • (1997) IEEE Journal of Solid-state Circuits , vol.22 , Issue.5
    • Tanzawa1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.