Fast error-correcting circuits for fault-tolerant memory

Records of the IEEE International Workshop on Memory Technology, Design and Testing

Volumn , Issue , 2004, Pages 8-12

  Ou, Elaine ^a   Yang, Woodward ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR-CORRECTING CIRCUITS; FAULT-TOLERANT MEMORY; PRODUCTION COST; SEMICONDUCTOR MEMORY;

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DECODING; DYNAMIC RANDOM ACCESS STORAGE; ERROR CORRECTION; FLASH MEMORY; NETWORKS (CIRCUITS); STATIC RANDOM ACCESS STORAGE; TRANSISTORS;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 10044243787     PISSN: 10874852     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.2004.1327977     Document Type: Conference Paper

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