Measurement of the Adsorption of Cytochrome c onto the External Surface of a Thin-Film Mesoporous Silicate by Ellipsometry

Langmuir

Volumn 20, Issue 2, 2004, Pages 532-536

  Deere, J ^a   Serantoni, M ^a   Edler, K J ^b   Hodnett, B K ^a   Wall, J G ^a   Magner, E ^a  

^a UNIVERSITY OF LIMERICK   (Ireland)

^b University of Bath Claverton Down   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; BROMINE COMPOUNDS; DEPOSITION; DNA; ELLIPSOMETRY; HYDROPHILICITY; HYDROPHOBICITY; MESOPOROUS MATERIALS; SILICON WAFERS; SYNTHESIS (CHEMICAL); THICKNESS MEASUREMENT; THIN FILMS;

FILM DEPOSITION; X RAY REFLECTIVITY;

SILICATES;

CYTOCHROME C; SILICATE;

ADSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; SURFACE PROPERTY;

ADSORPTION; CYTOCHROMES C; MICROSCOPY, ATOMIC FORCE; SILICATES; SURFACE PROPERTIES;

EID: 0942299084     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la035358y     Document Type: Article

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