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Optics Express
Volumn 10, Issue 23, 2002, Pages 1361-1367
Focus errors and their correction in microscopic deformation analysis using correlation
Author keywords

[No Author keywords available]
Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; CURVE FITTING; DEFORMATION; ERROR ANALYSIS; INTERPOLATION; SENSITIVITY ANALYSIS; STRAIN;
EID: 0942280648     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.10.001361     Document Type: Article
Times cited : (9)
References (11)
  • 1
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  • 2
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    • Sjödahl, M.1
  • 3
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    • Electronic speckle photography: Increased accuracy by nonintegral pixel shifting
    • M. Sjödahl, "Electronic speckle photography: increased accuracy by nonintegral pixel shifting," Appl. Opt. 33, 6667-6673 (1994).
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    • Sjödahl, M.1
  • 4
    • 0031192165 scopus 로고    scopus 로고
    • Measuring microscopic deformations with digital image correlation
    • Z. Sun, J. S. Lyons and S. R. McNeill, "Measuring microscopic deformations with digital image correlation," Opt. Laser Eng. 27, 409-428 (1997).
    • (1997) Opt. Laser Eng. , vol.27 , pp. 409-428
    • Sun, Z.1    Lyons, J.S.2    McNeill, S.R.3
  • 5
    • 0035415002 scopus 로고    scopus 로고
    • Subpixel displacement and deformation gradient measurement using digital image/speckle correlation (DISC)
    • P. Zhou and K. E. Goodson, "Subpixel displacement and deformation gradient measurement using digital image/speckle correlation (DISC)," Opt. Eng. 40, 1613-1620 (2001).
    • (2001) Opt. Eng. , vol.40 , pp. 1613-1620
    • Zhou, P.1    Goodson, K.E.2
  • 6
    • 0035425174 scopus 로고    scopus 로고
    • MicroDAC strain measurements for electronics packaging structure
    • D. Vogel, V. Grosser, A. Schubert and B. Michel, "MicroDAC strain measurements for electronics packaging structure," Opt. Laser Eng. 36, 195-211 (2001).
    • (2001) Opt. Laser Eng. , vol.36 , pp. 195-211
    • Vogel, D.1    Grosser, V.2    Schubert, A.3    Michel, B.4
  • 7
    • 0038925218 scopus 로고    scopus 로고
    • Subpixel microscopic deformation analysis using correlation and artificial neural networks
    • M. C. Pitter, C. W. See and M. G. Somekh, "Subpixel microscopic deformation analysis using correlation and artificial neural networks," Opt. Express 8, 322-327 (2001), http://www.opticsexpress.org/abstract.cfm?URI= OPEX-8-6-322.
    • (2001) Opt. Express , vol.8 , pp. 322-327
    • Pitter, M.C.1    See, C.W.2    Somekh, M.G.3
  • 8
    • 0032419716 scopus 로고    scopus 로고
    • Recent advances of moiré and microscopic moiré interferometry for thermal deformation analyses of microelectronic devices
    • B. Han, "Recent advances of moiré and microscopic moiré interferometry for thermal deformation analyses of microelectronic devices," Exp. Mech. 38, 278-288 (1998).
    • (1998) Exp. Mech. , vol.38 , pp. 278-288
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  • 10
    • 0031636309 scopus 로고    scopus 로고
    • FFTW: An adaptive software architecture for the FFT
    • M. Frigo and S. G. Johnson, "FFTW: an adaptive software architecture for the FFT," in Proc. ICASSP 3 (1998), pp. 1381-1384, http://www.fftw.org/fftw-paper-icassp.pdf.
    • (1998) Proc. ICASSP , vol.3 , pp. 1381-1384
    • Frigo, M.1    Johnson, S.G.2
  • 11
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    • Use of the Levenberg-Marquardt (damped least-squares) optimization method in lens design
    • M. J. Kidger, "Use of the Levenberg-Marquardt (damped least-squares) optimization method in lens design," Opt. Eng. 32, 1731-1739 (1993).
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    • Kidger, M.J.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.