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Volumn , Issue , 2003, Pages 957-960

High frequency micromechanical piezo-on-silicon block resonators

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC WAVES; FABRICATION; IMPEDANCE MATCHING (ELECTRIC); PIEZOELECTRIC DEVICES; PIEZOELECTRIC TRANSDUCERS; SILICA; SINGLE CRYSTALS; SPUTTER DEPOSITION; SUBSTRATES;

EID: 0842266485     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (36)

References (8)
  • 2
    • 0041886902 scopus 로고    scopus 로고
    • High-Q single-crystal silicon HARPSS capacitive beam resonators with self-aligned sub-100-nm transduction gaps
    • August
    • S. Pourkamali, A. Hashimura, R. Abdolvand, G. K. Ho, A. Erbil, F. Ayazi, "High-Q single-crystal silicon HARPSS capacitive beam resonators with self-aligned sub-100-nm transduction gaps", Journal of Microelectromechanical Systems, vol. 12, N 4, August 2003, pp. 487-496.
    • (2003) Journal of Microelectromechanical Systems , vol.12 , Issue.4 , pp. 487-496
    • Pourkamali, S.1    Hashimura, A.2    Abdolvand, R.3    Ho, G.K.4    Erbil, A.5    Ayazi, F.6
  • 5
    • 0038494584 scopus 로고    scopus 로고
    • Voltage-tunable piezoelectrically-transduced single-crystal silicon micromechanical resonators on SOI wafer
    • Kyoto, Japan, Jan.
    • G. Piazza, R. Abdolvand, F. Ayazi, "Voltage-tunable piezoelectrically-transduced single-crystal silicon micromechanical resonators on SOI wafer", Proc. IEEE MEMS'03, Kyoto, Japan, Jan. 2003, pp. 149-152.
    • (2003) Proc. IEEE MEMS'03 , pp. 149-152
    • Piazza, G.1    Abdolvand, R.2    Ayazi, F.3
  • 8
    • 34249014932 scopus 로고
    • Measurement of elastic constants at low temperature by means of ultrasonic waves data for silicon and germanium single crystals and for fused silica
    • H. J. Mcskimin, "Measurement of elastic constants at low temperature by means of ultrasonic waves data for silicon and germanium single crystals and for fused silica", Journal of Applied Physics, vol. 24, 1953, pp. 988997.
    • (1953) Journal of Applied Physics , vol.24 , pp. 988997
    • McSkimin, H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.