Precise growth of high uniformity vertical cavity devices using tunable dynamic optical reflectometry

Journal of Crystal Growth

Volumn 201, Issue , 1999, Pages 1028-1031

  Van Dijk, F ^a   Bardinal, V ^a   Fontaine, C ^a   Bedel Pereira, E ^a   Munoz Yague A ^a  

^a LAAS CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; MULTILAYERS; SEMICONDUCTOR DEVICE STRUCTURES; TERNARY SYSTEMS;

MICROCAVITY SEMICONDUCTOR DEVICES; TUNABLE DYNAMIC OPTICAL REFLECTOMETRY (TDOR);

MOLECULAR BEAM EPITAXY;

EID: 0032678557     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)01514-0     Document Type: Article

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