A simple micromachining approach to testing nanoscale metal-self-assembled monolayer-metal junctions

Nanotechnology

Volumn 15, Issue 1, 2004, Pages 86-91

  Wynn, C M ^a   Fedynyshyn, T H ^a   Geis, M W ^a   Kunz, R R ^a   Lyszczarz, T M ^a   Rothschild, M ^a   Spector, S J ^a   Switkes, M ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROMACHINING; MONOLAYERS; PHOTOLITHOGRAPHY; PRESSURE; SELF ASSEMBLY; TRANSPORT PROPERTIES;

ELECTRICAL TRANSPORT CHARACTERISTICS; NANOSCALE; SELF ASSEMBLED MONOLAYERS;

NANOTECHNOLOGY;

EID: 0742269374     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/1/017     Document Type: Article

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