-
1
-
-
0031097281
-
-
Joachim Krug, Adv. Phys. 46, 139 (1997); for a discussion of unstable MBE growth, see pp. 238-244.
-
(1997)
Adv. Phys.
, vol.46
, pp. 139
-
-
-
3
-
-
36849110552
-
-
Gert Ehrlich and F. G. Hudda, J. Chem. Phys. 44, 1039 (1966).
-
(1966)
J. Chem. Phys.
, vol.44
, pp. 1039
-
-
Hudda, F.1
-
4
-
-
0031191584
-
-
Kentaro Kyuno and G. Ehrlich, Surf. Sci. 383, L766 (1997).
-
(1997)
Surf. Sci.
, vol.383
, pp. L766
-
-
Ehrlich, G.1
-
5
-
-
3343020032
-
-
M. D. Johnson, C. Orme, A. W. Hunt, D. Graff, J. Sudijono, L. M. Sander, and B. G. Orr, Phys. Rev. Lett. 72, 116 (1994).
-
(1994)
Phys. Rev. Lett.
, vol.72
, pp. 116
-
-
Johnson, M.1
Orme, C.2
Hunt, A.3
Graff, D.4
Sudijono, J.5
Sander, L.6
Orr, B.7
-
6
-
-
5844271216
-
-
Martin Siegert and Michael Plischke, Phys. Rev. Lett. 73, 1517 (1994).
-
(1994)
Phys. Rev. Lett.
, vol.73
, pp. 1517
-
-
-
7
-
-
0000982060
-
-
Martin Siegert and Michael Plischke, Phys. Rev. E 53, 307 (1996).
-
(1996)
Phys. Rev. E
, vol.53
, pp. 307
-
-
-
8
-
-
0000959204
-
-
Joseph E. Van Nostrand, S. Jay Chey, M.-A. Hasan, David G. Cahill, and J. E. Greene, Phys. Rev. Lett. 74, 1127 (1995).
-
(1995)
Phys. Rev. Lett.
, vol.74
, pp. 1127
-
-
Jay Chey, S.1
Greene, J.2
-
9
-
-
0000361068
-
-
A diffusion bias for surface vacancies is thought to drive pattern formation during ion-etching; see, for example, S. Jay Chey, Joseph E. Van Nostrand, and David G. Cahill, Phys. Rev. B 52, 16 696 (1995).
-
(1995)
Phys. Rev. B
, vol.52
, pp. 16696
-
-
Jay Chey, S.1
-
10
-
-
0030381457
-
-
Martin Rost, Pavel Šmilauer, and Joachim Krug, Surf. Sci. 369, 393 (1996).
-
(1996)
Surf. Sci.
, vol.369
, pp. 393
-
-
-
11
-
-
0001609410
-
-
Paolo Politi and Jacques Villain, Phys. Rev. B 54, 5114 (1996).
-
(1996)
Phys. Rev. B
, vol.54
, pp. 5114
-
-
-
12
-
-
0001061787
-
-
Pavel Šmilauer and Dimitri D. Vvedensky, Phys. Rev. B 52, 14 263 (1995).
-
(1995)
Phys. Rev. B
, vol.52
, pp. 14263
-
-
-
13
-
-
0000337793
-
-
Jacques G. Amar and Fereydoon Family, Phys. Rev. Lett. 77, 4584 (1996).
-
(1996)
Phys. Rev. Lett.
, vol.77
, pp. 4584
-
-
-
14
-
-
2842523708
-
-
Jacques G. Amar and Fereydoon Family, Phys. Rev. B 54, 14 742 (1996).
-
(1996)
Phys. Rev. B
, vol.54
, pp. 14742
-
-
-
15
-
-
0001547189
-
-
H.-J. Ernst, F. Fabre, R. Folkerts, and J. Lapujoulade, Phys. Rev. Lett. 72, 112 (1994).
-
(1994)
Phys. Rev. Lett.
, vol.72
, pp. 112
-
-
Fabre, F.1
Folkerts, R.2
Lapujoulade, J.3
-
16
-
-
0030083322
-
-
Joseph E. Van Nostrand, S. Jay Chey, David G. Cahill, A. E. Botchkarev, and H. Morkoç, Surf. Sci. 346, 136 (1996).
-
(1996)
Surf. Sci.
, vol.346
, pp. 136
-
-
Jay Chey, S.1
Botchkarev, A.2
Morkoç, H.3
-
17
-
-
0000500443
-
-
Joseph A. Stroscio, D. T. Pierce, M. D. Stiles, A. Zangwill, and L. M. Sander, Phys. Rev. Lett. 75, 4246 (1995).
-
(1995)
Phys. Rev. Lett.
, vol.75
, pp. 4246
-
-
Pierce, D.1
Stiles, M.2
Zangwill, A.3
Sander, L.4
-
18
-
-
4243241445
-
-
F. Tsui, J. Wellman, C. Uher, and Roy Clarke, Phys. Rev. Lett. 76, 3164 (1996).
-
(1996)
Phys. Rev. Lett.
, vol.76
, pp. 3164
-
-
Tsui, F.1
Wellman, J.2
Uher, C.3
-
19
-
-
0001486101
-
-
N.-E. Lee, David G. Cahill, and J. E. Greene, Phys. Rev. B 53, 7876 (1996).
-
(1996)
Phys. Rev. B
, vol.53
, pp. 7876
-
-
Greene, J.1
-
20
-
-
0000887288
-
-
W. C. Elliott, P. F. Miceli, T. Tse, and P. W. Stephens, Phys. Rev. B 54, 17 938 (1996).
-
(1996)
Phys. Rev. B
, vol.54
, pp. 17938
-
-
Elliott, W.1
Miceli, P.2
Tse, T.3
Stephens, P.4
-
22
-
-
0029345763
-
-
Joseph E. Van Nostrand, S. Jay Chey, and David G. Cahill, J. Vac. Sci. Technol. A 13, 1816 (1995). In this paper, we made an error in measuring the growth temperature of the 200-nm-thick film; the correct growth temperature for the 200 nm film is 175 °C.
-
(1995)
J. Vac. Sci. Technol. A
, vol.13
, pp. 1816
-
-
Jay Chey, S.1
-
24
-
-
33744612571
-
-
X.-J. Zhang, G. Xue, A. Agarwal, R. Tsu, M.-A. Hasan, J. E. Greene, and A. Rockett, J. Vac. Sci. Technol. A 11, 2553 (1993).
-
(1993)
J. Vac. Sci. Technol. A
, vol.11
, pp. 2553
-
-
Xue, G.1
Agarwal, A.2
Tsu, R.3
Greene, J.4
Rockett, A.5
-
25
-
-
4243604305
-
-
S. Jay Chey, Joseph E. Van Nostrand, and David G. Cahill, Phys. Rev. Lett. 76, 3995 (1996).
-
(1996)
Phys. Rev. Lett.
, vol.76
, pp. 3995
-
-
Jay Chey, S.1
-
26
-
-
0027929621
-
-
Jean Lapujoulade, Surf. Sci. Rep. 20, 191 (1994); see pp. 197 and 235.
-
(1994)
Surf. Sci. Rep.
, vol.20
, pp. 191
-
-
-
27
-
-
6244251920
-
-
An approximately linear roughening rate for Si(001) was originally observed using Ge marker layers and cross-sectional TEM; see D. J. Eaglesham, J. Appl. Phys. 77, 3597 (1995).
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 3597
-
-
Eaglesham, D.1
-
30
-
-
0001098515
-
-
The factor of 20 in the relation (Formula presented) is derived from a fit to the island densities produced in computer simulations of growth; see G. S. Bales and D. C. Chrzan, Phys. Rev. B 50, 6057 (1994).
-
(1994)
Phys. Rev. B
, vol.50
, pp. 6057
-
-
Bales, G.1
Chrzan, D.2
-
31
-
-
3342968424
-
-
Y. W. Mo, J. Kleiner, M. B. Webb, and M. G. Lagally, Phys. Rev. Lett. 66, 1998 (1991).
-
(1991)
Phys. Rev. Lett.
, vol.66
, pp. 1998
-
-
Mo, Y.1
Kleiner, J.2
Webb, M.3
Lagally, M.4
-
33
-
-
0031373702
-
-
For a recent discussion of microscopy results for high-index Si surfaces; see A. A. Basaki, S. C. Erwin, and L. J. Whitman, Surf. Sci. 392, 69 (1997).
-
(1997)
Surf. Sci.
, vol.392
, pp. 69
-
-
Basaki, A.1
Erwin, S.2
Whitman, L.3
|