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Assuming the worst case in our experiments with a 40-nm tip radius results in [G(ρ, t)(Formula presented) being underestimated by 20% for films with mound separations d<20 and 10% for films with larger mound separations. These uncertainties, which are inherent in the AFM measurements, were included in determining the overall uncertainties quoted in the text for the effective roughening and growth exponents (Formula presented) and (Formula presented)
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The effects of using a finite tip radius can be estimated based upon a model developed by J. E. Griffith and D. A. Grigg, J. Appl. Phys. 74, R83 (1993). Assuming the worst case in our experiments with a 40-nm tip radius results in [G(ρ, t)(Formula presented) being underestimated by 20% for films with mound separations d<20 and 10% for films with larger mound separations. These uncertainties, which are inherent in the AFM measurements, were included in determining the overall uncertainties quoted in the text for the effective roughening and growth exponents (Formula presented) and (Formula presented).
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