Noise probe for bias-dependent current-path rearrangements in disordered solids

Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 18, 1997, Pages R11919-R11922

  Bloom, I ^a   Reznik, S ^a   Balberg, I ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010243248     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.R11919     Document Type: Article

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