An in-situ TEM nanoindenter system with 3-axis inertial positioner

Materials Research Society Symposium - Proceedings

Volumn 778, Issue , 2003, Pages 105-110

  Bobji, M S ^a   Ramanujan, C S ^a   Doole, R C ^a   Pethica, J B ^a   Inkson, B J ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; INDENTATION; INTERFEROMETERS; NANOSTRUCTURED MATERIALS; STRAIN; STRESSES;

FIBRE OPTIC INTERFEROMETER; IN SITU NANOINDENTER SYSTEM; THREE-AXIS INERTIAL POSITIONER;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0348198347     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-778-u4.5     Document Type: Conference Paper

References (10)

1. R.W. Siegel and G.E. Fougere, Nanostructured materials, 6, 205 (1995).
2. J.B. Savader, M.R. Scanlon, R.C. Cammarata, D.T. Smith and C. Hayzelden, Scripta Mater., 36 (1), 29 (1997).
3. D. Josell, D. van Heerden, D. Read, J. Bonevich and D. Shechtman, J. Mater. Res., 13, 10 (1998).
4. T.E. Mitchell, Y.C. Lu, A.J. Griffin, M. Natasi and H. Kung, J. Am. Ceram. Soc., 80 (7), 1673 (1997).
5. B.M. Clemens, H.Kung and S.A. Barnett, MRS Bulletin, 24 (2), 20 (1999).
6. W.D. Sproul, Science, 273, 889 (1996).
7. J. B. Pethica, R. Hutchings, and W.C. Oliver, Phil. Mag. A, 48 (4), 593 (1983).
8. T.Kizuka, K. Yamada, S. Deguchi, M. Naruse and N. Tanaka, Phys. Rev. B 55 R7398 (1997).
9. M.A. Wall and U. Dahmen, Microsc. Res. & Tech. 42, 248 (1998).
10. D.W. Pohl (1987) Surf. Sci. 181, 174.