Exploring the Photorefractive Effect in Polymer-Dispersed Liquid Crystals Using Near-Field Scanning Optical Microscopy

Journal of Physical Chemistry B

Volumn 107, Issue 51, 2003, Pages 14211-14218

  Hall, Jeffrey E ^a   Higgins, Daniel A ^a  

^a KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; BIREFRINGENCE; CONDUCTIVE FILMS; DATA REDUCTION; DOPING (ADDITIVES); DYES; ELECTRIC FIELD EFFECTS; FLUORESCENCE; IMAGE RECORDING; NAPHTHALENE; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PHOTOREFRACTIVE MATERIALS;

PHOTOGENERATION; PHOTOREFRACTIVITY;

LIQUID CRYSTALS;

EID: 0348170624     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp036466w     Document Type: Article

References (52)

1. Cipparrone, G.; Mazzulla, A.; Nicoletta, F.; Lucchetti, L.; Simoni, F. Opt. Commun. 1998, 297.
2. Ono, H.; Kawatsuki, N. Proc. SPIE 1998, 3475, 122.
3. Kippelen, B.; Volodin, B.; Meerholz, K.; Javidi, B.; Peyghambarian, N. Nature 1996, 383, 58.
4. Zilker, S. Chem. Phys. Chem. 2000, 1, 72.
5. Ashkin, A.; Boyd, G. D.; Dziedzic, J. M.; Smith, R. G.; Ballman, A. A.; Levinstein, J. J.; Nassau, K. Appl. Phys. Lett. 1966, 9, 72.
6. Moerner, W. E.; Grunnet-Jepsen, A.; Thompson, C. L.; Twieg, R. J. Appl. Phys. Lett. 1997, 70, 1515.
7. Moerner, W. E.; Silence, S. Chem. Rev. 1994, 94, 127.
8. Yu, L.; Chan, W. K.; Peng, Z.; Gharavi, A. Acc. Chem. Res. 1996, 29, 13.
9. Van Steenwinckel, D.; Hendrickx, E.; Persoons, A. J. Chem. Phys. 2001, 114, 9557.
10. Wiederrecht, G. Mol. Supramol. Photochem. 2001, 7, 319.
11. Wiederrecht, G.; Yoon, B.; Wasielewski, M. Science 1995, 270, 1794.
12. Khoo, I. C.; Li, H.; Liang, Y. Opt. Lett. 1994, 19, 1723.
13. Ono, H.; Kawatsuki, N. Recent Res. Dev. Appl. Phys. 1998, 47.
14. Cipparrone, G.; Mazzulla, A.; Simoni, F. Mol. Cryst. Liq. Cryst. 1997, 299, 329.
15. Wiederrecht, G.; Wasielewski, M. J. Nonlinear Opt. Phys. Mater. 1999, 8, 107.
16. Khoo, I. C.; Guenther, B. D.; Wood, M. V.; Chen, P.; Shin, M.-Y. Opt. Lett. 1997, 22, 1229.
17. Khoo, I. C.; Guenther, B. D.; Slussarenko, S. Mol. Cryst. Liq. Cryst. 1998, 321, 419.
18. Golemme, A.; Kippelen, B.; Peyghambarian, N. Appl. Phys. Lett. 1998, 73, 2408.
19. Golemme, A.; Kippelen, B.; Maldonado, J.; Peyghambarian, N. Proc. SPIE 1998, 3297, 28.
20. Golemme, A.; Kippelen, B.; Peyghambarian, N. Chem. Phys. Lett. 2000, 319, 655.
21. Harootunian, A.; Betzig, E.; Isaacson, M.; Lewis, A. Appl. Phys. Lett. 1986, 49, 674.
22. Dürig, U.; Pohl, D. W.; Rohner, F. J. Appl. Phys. 1986, 59, 3318.
23. Betzig, E.; Trautman, J. K.; Harris, T. D.; Weiner, J. S.; Kostelak, R. L. Science 1991, 251, 1468.
24. Vanden Bout, D. A.; Kerimo, J.; Higgins, D. A.; Barbara, P. F. Acc. Chem. Res. 1997, 30, 204.
25. Dunn, R. C. Chem. Rev. 1999, 99, 2891.
26. Higgins, D. A.; Mei, E. Near-Field Scanning Optical Microscopy. In Scanning Probe Microscopy and Spectroscopy. Theory, Techniques, and Applications. 2nd ed.; Bonnell, D., Ed.; Wiley-VCH: New York, 2001; p 371.
27. Mei, E.; Higgins, D. A. J. Chem. Phys. 2000, 112, 7839.
28. Higgins, D. A.; Liao, X.; Hall, J. E.; Mei, E. J. Phys. Chem. B 2001, 105, 5874.
29. Mei, E.; Higgins, D. A. Appl. Phys. Lett. 1998, 73, 3515.
30. Mei, E.; Higgins, D. A. J. Phys. Chem. 1998, 102, 7558.
31. Drzaic, P. S. Liq. Cryst. 1988, 3, 1543.
32. Jain, S. C.; Rout, D. K. J. Appl. Phys. 1991, 70, 6988.
33. Jain, S. C.; Thakur, R. S.; Lakshmikumar, S. T. J. Appl. Phys. 1993, 73, 3744.
34. Lin, H.; Ding, H.; Kelly, J. R. Mol. Cryst. Liq. Cryst. 1995, 262, 99.
35. Erdmann, J.; Doane, J. W.; Zumer, S.; Chidichimo, G. Proc. SPIE 1989, 1080, 32.
36. Wu, B.-G.; Erdmann, J. H.; Doane, J. W. Liq. Cryst. 1989, 5, 1453.
37. Amundson, K. Phys. Rev. E 1996, 53, 2412.
38. Higgins, D. A.; Luther, B. J. J. Chem. Phys. 2003, 119, 3935.
39. Higgins, D. A. Adv. Mater. 2000, 12, 251.
40. Zumer, S.; Doane, J. W. Phys. Rev. A 1986, 34, 3373.
41. Mei, E.; Higgins, D. A. Appl. Phys. Lett. 1999, 75, 430.
42. Higgins, D. A.; Mei, E.; Liao, X. Proc. SPIE 1999, 3607, 26.
43. Wiederrecht, G.; Svec, W.; Niemczyk, M.; Wasielewski, M. J. Phys. Chem. 1995, 99, 8918.
44. Hall, J. E.; Higgins, D. A. Polym. Mater. Sci. Eng. 2003, 88, 186.
45. Karrai, K.; Grober, R. Appl. Phys. Lett. 1995, 66, 1842.
46. Hall, J. E.; Higgins, D. A. Rev. Sci. Instrum. 2002, 73, 2103.
47. Ondris-Crawford, R.; Boyko, E. P.; Wagner, B. G.; Erdmann, J. H.; Zumer, S.; Doane, J. W. J. Appl. Phys. 1991, 69, 6380.
48. Springer, G. H.; Higgins, D. A. J. Am. Chem. Soc. 2000, 122, 6801.
49. Mei, E.; Higgins, D. A. Langmuir 1998, 14, 1945.
50. Greenfield, S. R.; Svec, W. A.; Gosztola, D.; Wasielewski, M. R. J. Am. Chem. Soc. 1996, 118, 6767.
51. Feldberg, S. W. J. Phys. Chem. 1970, 74, 87.
52. Bard, A. J.; Faulkner, L. R. Electrochemical Methods: Fundamentals and Applications; John Wiley and Sons: New York, 1980.