Performance and reliability of single halo deep sub-micron p-MOSFETs for analog applications

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn 2002-January, Issue , 2002, Pages 35-39

  Jha, N K ^a   Baghini, M S ^a   Rao, V R ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

Author keywords

CMOS analog integrated circuits; CMOS technology; Degradation; Hot carriers; Implants; MOS devices; MOSFET circuits; Occupational stress; Transconductance; Voltage

Indexed keywords

ANALOG INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; DEGRADATION; DENTAL PROSTHESES; ELECTRIC NETWORK ANALYSIS; ELECTRIC POTENTIAL; FAILURE ANALYSIS; HOT CARRIERS; INTEGRATED CIRCUITS; MOS DEVICES; TRANSCONDUCTANCE;

ANALOG APPLICATIONS; CHANNEL HOT CARRIERS; CMOS ANALOG INTEGRATED CIRCUITS; CMOS TECHNOLOGY; CONVENTIONAL MOSFETS; MOSFET CIRCUITS; OCCUPATIONAL STRESS; PERFORMANCE AND RELIABILITIES;

MOSFET DEVICES;

EID: 0348153060     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2002.1025608     Document Type: Conference Paper

References (7)

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