Time domain multiplexed TAM: Implementation and comparison

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2003, Pages 732-737

  Ebadi, Zahra Sadat ^a   Ivanov, Andre ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

Embedded core testing; Optimal test time; SoC testing; Test Access Mechanism (TAM); Time domain multiplexed TAM

Indexed keywords

EMBEDDED CORE TESTING; SOC TESTING; TEST ACCESS MECHANISM; TEST TIME; TIME DOMAIN;

DESIGN; EXHIBITIONS; INTEGRATED CIRCUIT TESTING; MULTIPLEXING;

PROGRAMMABLE LOGIC CONTROLLERS;

EID: 0348129793     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2003.1253694     Document Type: Conference Paper

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