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Volumn 40, Issue 1, 2004, Pages 80-81
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Microwave noise performances of AlGaN/GaN HEMTS on semi-insulating 6H-SiC substrates
a a a a b b b b a |
Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC NOISE;
CURRENT DENSITY;
ELECTRIC INSULATING MATERIALS;
ELECTRON BEAM LITHOGRAPHY;
GATES (TRANSISTOR);
INDUCTIVELY COUPLED PLASMA;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MICROWAVES;
MOLECULAR BEAM EPITAXY;
REACTIVE ION ETCHING;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SILICON CARBIDE;
SILICON WAFERS;
TRANSCONDUCTANCE;
DRAIN VOLTAGE;
TRANSFER LENGTH METHOD (TLM);
HIGH ELECTRON MOBILITY TRANSISTORS;
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EID: 0347760403
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20040012 Document Type: Article |
Times cited : (13)
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References (8)
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