Analysis of CMOS photodiodes - Part II: Lateral photoresponse

IEEE Transactions on Electron Devices

Volumn 50, Issue 5, 2003, Pages 1239-1245

  Lee, Ji Soo ^a   Hornsey, Richard I ^b   Renshaw, David ^c  

^a UNIVERSITY OF WATERLOO   (Canada)

^b YORK UNIVERSITY   (Canada)

^c UNIVERSITY OF EDINBURGH   (United Kingdom)

Author keywords

Active pixel sensor (APS); CMOS image sensor; CMOS photodiode; Edge effect; Lateral diffusion; Lateral photoresponse; Quantum efficiency

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DIFFUSION; INTERFACES (MATERIALS); QUANTUM EFFICIENCY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SILICA;

CMOS PHOTODIODES; LATERAL PHOTORESPONSE; NUMERICAL DEVICE SIMULATION;

PHOTODIODES;

EID: 0042405184     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.813233     Document Type: Article

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