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Volumn 16, Issue 12, 2003, Pages 1365-1367
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Electrical transport characteristics of Bi2Sr2CaCu2O8+δ stacked junctions with control of the carrier density
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
BISMUTH COMPOUNDS;
CARRIER CONCENTRATION;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
ELECTRIC NETWORK PARAMETERS;
ELECTRIC PROPERTIES;
ELECTRIC RESISTANCE;
ELECTRICAL TRANSPORT CHARACTERISTICS;
INTRINSIC JOSEPHSON JUNCTIONS;
JUNCTION PARAMETERS;
JUNCTION RESISTANCE;
JOSEPHSON JUNCTION DEVICES;
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EID: 0347043619
PISSN: 09532048
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-2048/16/12/009 Document Type: Conference Paper |
Times cited : (3)
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References (18)
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