Disorder/order phase transition in C60 thin films studied by surface photovoltage spectroscopy

Journal of Applied Physics

Volumn 94, Issue 11, 2003, Pages 7173-7177

  Katz, E A ^a   Faiman, D ^a   Mishori, B ^b,d   Shapira, Yoram ^b   Isakina, A ^c   Strzhemechny, M A ^c  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b TEL AVIV UNIVERSITY   (Israel)

^c B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^d Tower Semiconductors Ltd ^*  (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CARRIER MOBILITY; CHARGE CARRIERS; CRYSTAL LATTICES; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; MOLECULAR CRYSTALS; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; ROTATION; THERMAL EFFECTS; VAN DER WAALS FORCES; X RAY POWDER DIFFRACTION;

INTERMOLECULAR FORCES; NONMONOTONIC BEHAVIORS; ROTATIONAL STATES; SURFACE PHOTOVOLTAGE SPECTROSCOPY (SPV); TEMPERATURE VARIATIONS;

THIN FILMS;

EID: 0346962342     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1625083     Document Type: Article

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