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Volumn 675, Issue , 2001, Pages
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Effect of crystalline structure and impurity content of C60 thin films on the order/disorder phase transition
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL IMPURITIES;
CRYSTAL STRUCTURE;
GRAIN SIZE AND SHAPE;
LATTICE CONSTANTS;
MORPHOLOGY;
ORDER DISORDER TRANSITIONS;
POLYCRYSTALLINE MATERIALS;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
TEMPERATURE-RESOLVED X-RAY DIFFRACTION;
VACUUM DEPOSITION;
FULLERENES;
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EID: 0035559512
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (17)
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