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Volumn 675, Issue , 2001, Pages

Effect of crystalline structure and impurity content of C60 thin films on the order/disorder phase transition

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL IMPURITIES; CRYSTAL STRUCTURE; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; MORPHOLOGY; ORDER DISORDER TRANSITIONS; POLYCRYSTALLINE MATERIALS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0035559512     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.