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Volumn 52, Issue 10, 2003, Pages 516-520
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New Techniques for Corrosion Measurement - Application and Problem on Microdamage Measurement
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Author keywords
AFM; KFM; SECM and QCM; STM
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTROCHEMISTRY;
SCANNING ELECTRON MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
CORROSION MEASUREMENT;
SCANNING PROBE MICROSCOPY (SPM);
CORROSION;
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EID: 0346958573
PISSN: 09170480
EISSN: None
Source Type: Journal
DOI: 10.3323/jcorr1991.52.516 Document Type: Review |
Times cited : (4)
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References (20)
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