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Volumn 62, Issue 12, 1998, Pages 1183-1188
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Possibility of observation of water film by measuring surface potential distribution
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Author keywords
Atomic force microscope; Kelvin force mode; KFM; Surface potential; Water film
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FILMS;
GRAPHITE;
MICA;
SOLUTIONS;
SURFACE MEASUREMENT;
WATER;
KELVIN FORCE MODE;
SURFACE POTENTIAL DISTRIBUTION;
WATER FILMS;
SURFACE PHENOMENA;
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EID: 0032261557
PISSN: 00214876
EISSN: None
Source Type: Journal
DOI: 10.2320/jinstmet1952.62.12_1183 Document Type: Article |
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Times cited : (2)
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References (4)
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