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Volumn 72, Issue 11, 2003, Pages 2850-2855
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Step bunching with alternation of structural parameters
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Author keywords
Drift of adatoms; Si(001) vicinal face; Step bunching
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Indexed keywords
SILICON;
ARTICLE;
DIFFUSION;
DIFFUSION COEFFICIENT;
EVAPORATION;
KINETICS;
MOLECULAR MODEL;
MONTE CARLO METHOD;
STRUCTURE ANALYSIS;
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EID: 0346895237
PISSN: 00319015
EISSN: None
Source Type: Journal
DOI: 10.1143/JPSJ.72.2850 Document Type: Article |
Times cited : (7)
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References (19)
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