Electron beam induced optical and electronical properties of SiO2

Materials Science and Engineering: B

Volumn 71, Issue 1-3, 2000, Pages 109-114

  Fitting, H J ^a   Barfels, T ^a   Von Czarnowski, A ^a   Trukhin, A N ^b  

^a UNIVERSITY OF ROSTOCK   (Germany)

^b UNIVERSITY OF LATVIA   (Latvia)

Author keywords

Charge injection; IR mode softening; Irradiation defects; Luminescence centres; Silica

Indexed keywords

EID: 0004622604     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00359-1     Document Type: Article

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