Effect of alloy composition on track formation in relaxed Si 1-xGex

Physica B: Condensed Matter

Volumn 340-342, Issue , 2003, Pages 808-812

  Gaiduk, P I ^a,d   Trautmann, C ^b   Toulemonde, M ^c   Lundsgaard Hansen, J ^d   Nylandsted Larsen, A ^d  

^a BELARUSIAN STATE UNIVERSITY   (Belarus)

^b GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^c Centre Interdisciplinaire de Recherches Ions Laser   (France)

^d AARHUS UNIVERSITY   (Denmark)

Author keywords

SiGe alloys; Swift heavy ions; TEM; Tracks

Indexed keywords

COMPOSITION; CRYSTAL DEFECTS; CRYSTALLIZATION; ELECTRON MOBILITY; ION BOMBARDMENT; MORPHOLOGY; PHONONS; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

DEFECT DENSITY; SWIFT HEAVY IONS;

SILICON ALLOYS;

EID: 0346685983     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2003.09.218     Document Type: Conference Paper

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