Correlation of resistivity with zinc content in a vapor grown (Cd,Zn)Te:Se

Applied Physics Letters

Volumn 81, Issue 27, 2002, Pages 5153-5155

  Corregidor, V ^a   Dieguez E ^a   Castano J L ^a   Fiederle, M ^b   Babentsov, V ^b,c   Fauler, A ^b   Benz, K ^b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b UNIVERSITY OF FREIBURG   (Germany)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; ELECTRIC CONDUCTIVITY; INFRARED SPECTROSCOPY; PHOTOLUMINESCENCE; SELENIUM; VAPOR PHASE EPITAXY; X RAY ANALYSIS; ZINC;

MODIFIED MARKOV METHOD (MMM);

CRYSTAL GROWTH;

EID: 0346665857     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1533124     Document Type: Article

References (20)

1. R. B. James, T. E. Schlesinger, P. Siffert, and L. Franks, Semiconductors For Room-Temperature Radiation Detector Applications (Materials Research Society, Pittsburgh, 1993).
2. M. Fiederle, T. Feltgen, J. Meinhardt, M. Rogolla, and K. W. Benz, J. Cryst. Growth 197, 635 (1999).
3. M. Fiederle, T. Feltgen, M. Rogolla, J. Meinhardt, J. Ludwing, K. Runge, and K. W. Benz, Nucl. Instrum. Methods Phys. Res. A 434, 152 (1999).
4. A. Szczerbakow, J. Domagala, D. Rose, K. Durone, V. Y. Ivanov, and A. R. Omeltchuouk, J. Cryst. Growth 191, 673 (1998).
5. D. P. Halliday, M. D. G. Potter, J. T. Mullins, and A. W. Brinkman, J. Cryst. Growth 220, 30 (2000).
6. M. Zha, T. Görög, A Zappettini, F. Bissoli, L. Zanotti, and C. Paorici, J. Cryst. Growth 234, 184 (2002).
7. Y. Eisen and A. Shor, J. Cryst. Growth 184, 1302 (1998).
8. B. H. Tseng and C. Y. Chang, Mater. Sci. Eng., B 49, 1 (1997).
9. M. Fiederle, M. Rogolla, C. Joerger, M. Salk, D. G. Ebling, J. Ludwing, K. Runge, and K. W. Benz, Nucl. Instrum. Methods Phys. Res. A 380, 153 (1996).
10. D. Noda, T. Aoki, Y. Nakanishi, and Y. Hatanaka, J. Cryst. Growth 214, 1121 (2000).
11. W. Joerger, M. Laasch, T. Kunz, M. Fiederle, J. Meinhardt, K. W. Benz, K. Scholz, and G. Müller-Vogt, Cryst. Res. Technol. 32, 1103 (1997).
12. V. Corregidor, V. Babentsov, M. Fiederle, T. Feltgen, K. W. Benz, and E. Diéguez, J. Mater. Res. 17, 1069 (2002).
13. R. Stibal, J. Windscheif, and W. Jantz, Semicond. Sci. Technol. 6, 995 (1991).
14. J. M. Francou, K. Saminadayar, and J. L. Pautrat, Phys. Rev. B 41, 12035 (1990).
15. W. M. Duncan, R. J. Koestner, J. H. Tregilgas, H. Y. Liu, and M. C. Chen, Mater. Res. Soc. Symp. Proc. 161, 39 (1990).
16. J. Franc, P. Hlídek, P. Moravec, E. Belas, P. Höschl, L. Turjanska, and R. Varghová, Semicond. Sci. Technol. 15, 561 (2000).
17. S.-H. Wei, S. B. Zhang, and Alex Zunger, J. Appl. Phys. 87, 1304 (2000).
18. M. Fiederle, V. Babentsov, and J. Franc (unpublished).
19. M. Fiederle, C. Eiche, M. Salk, R. Schwarz, K. W. Benz, W. Stadler, D. M. Hofmann, and B. K. Meyer, J. Appl. Phys. 84, 6689 (1998).
20. U. Becker, P. Rudolph, R. Boyn, M. Wienecke, and I. Utke, Phys, Status Solidi A 120, 653 (1990).