Electron density fluctuations at interfaces in Nb/Si bilayer, trilayer, and multilayer films: An x-ray reflectivity study

Journal of Applied Physics

Volumn 87, Issue 11, 2000, Pages 7946-7958

  Suresh, N ^a   Phase, D M ^a   Gupta, Ajay ^a   Chaudhari, S M ^a  

^a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346634147     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373479     Document Type: Article

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