Instrumental developments and recent experiments in near-field optical microscopy

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 149-153

  Heinzelmann, H ^a   Lacoste, Th ^a   Huser, Th ^a   Guntherodt H J ^a   Hecht, B ^b   Pohl, D W ^b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

Light scattering; Nanostructures; Optical spectroscopy

Indexed keywords

IMAGING TECHNIQUES; LIGHT PROPAGATION; LIGHT SCATTERING; LIQUID CRYSTALS; MICROSCOPES; NANOSTRUCTURED MATERIALS; POLARIZATION; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

IMAGE CONTRAST; LIQUID CRYSTAL FILM; OPTICAL MICROSCOPE; POLARIZATION CONTRAST; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCANNING TUNNELING MICROSCOPE; SCANNING TUNNELING OPTICAL MICROSCOPE; TUNNELING NEAR FIELD OPTICAL MICROSCOPE;

OPTICAL MICROSCOPY;

EID: 0030079188     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06808-2     Document Type: Article

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