Monte Carlo Modeling of Generation of Characteristic, Continuous and Fluorescent X-rays by Electron Impact

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 10, 2003, Pages 6663-6671

  Nagatomi, Takaharu ^a   Hibi, Takaaki ^a   Takai, Yoshizo ^a   Obori, Ken Ichi ^a,b   Awata, Syogo ^a,b   Yurugi, Toshikazu ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b HORIBA LTD   (Japan)

Author keywords

Characteristic X ray; Continuous X ray; Electron impact; Fluorescent X ray; Monte Carlo simulation; X ray source

Indexed keywords

ALUMINUM; ELASTICITY; ELECTROMAGNETIC WAVE SCATTERING; ELECTRONS; FLUORESCENCE; GERMANIUM; MATHEMATICAL MODELS; MONTE CARLO METHODS; SCANDIUM; ZIRCONIUM;

ELECTRON IMPACT; X-RAY SOURCES;

X RAYS;

EID: 0346328660     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.6663     Document Type: Article

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