Yield of InxGa1-xAs superlattices under bending and nanoindentation

Materials Research Society Symposium - Proceedings

Volumn 778, Issue , 2003, Pages 43-48

  Lloyd, Stephen J ^a   P'ng, Ken M Y ^a   Bushby, Andy J ^b   Dunstan, David J ^b   Clegg, William J ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); INDENTATION; MULTILAYERS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR GROWTH; SEMICONDUCTOR SUPERLATTICES; STRAIN; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

FOCUSED ION BEAM MICROSCOPE; NANOINDENTATION; PLASTIC STRAIN;

SEMICONDUCTING INDIUM GALLIUM ARSENIDE;

EID: 0346020448     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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