Effect of the large current flow on the low-temperature transport properties in a bundle of single-walled carbon nanotubes

Applied Physics Letters

Volumn 83, Issue 18, 2003, Pages 3803-3805

  Fuse, T ^a,b   Moriyama, S ^a,b   Suzuki, M ^a,c   Aoyagi, Y ^a,b,c   Ishibashi, K ^a,b  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRON ENERGY LEVELS; GRAPH THEORY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; VOLTAGE MEASUREMENT;

COULOMB OSCILLATION; LOW-TEMPERATURE TRANSPORT PROPERTIES; SINGLE-WALLED CARBON NANOTUBE;

CARBON NANOTUBES;

EID: 0345359877     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1624641     Document Type: Article

References (12)

1. M. Bockrath, D. H. Cobden, P. L. McEuen, N. G. Chopra, A. Aettl, A. Thess, and R. E. Smally et al., Science 275, 1922 (1997).
2. K. Ishibashi, M. Suzuki, T. Ida, K. Tsukagoshi, and Y. Aoyagi, Jpn. J. Appl. Phys. 39, 7053 (2000).
3. K. Ishibashi, M. Suzuki, T. Ida, and Y. Aoyagi, Appl. Phys. Lett. 79, 1864 (2001).
4. K. Ishibashi, D. Tsuya, M. Suzuki, and Y. Aoyagi, Appl. Phys. Lett. 82, 3307 (2003).
5. The SWNTs were used as described in Ref. 6, in which the details of the fabrication process are also described.
6. M. Suzuki, K. Ishibashi, T. Ida, D. Tsuya, K. Toratani, and Y. Aoyagi, J. Vac. Sci. Technol. B 19, 2770 (2001).
7. P. G. Collins, M. S. Arnold, and P. Avouris, Science 292, 706 (2001).
8. T. Ando and T. Nakanishi, J. Phys. Soc. Jpn. 67, 1704 (1998).
9. P. L. McEuen, M. Bockrath, D. H. Cobden, Y. Yoon, and S. G. Louie, Phys. Rev. Lett. 83, 5098 (1998).
10. I. M. Ruzin, V. Chandrasekhar, E. I. Levin, and L. I. Glazman, Phys. Rev. B 45, 13469 (1992).
11. F. R. Waugh, M. J. Berry, D. J. Mar, and R. M. Westerevelt, Phys. Rev. Lett. 75, 705 (1995).
12. It should be noted that the Coulomb diamond measurement was carried out a few days after the 13th CF process. Since the sample condition was easily changed for the present sample, the microscopic details of the diamond do not necessarily coincide with the corresponding Coulomb oscillation measurement of Fig. 2(d). However, the general feature is to be discussed.