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Volumn 144-145, Issue , 1999, Pages 255-259

Spectromicroscopy of suicide phases formed at Ni/Si interfaces

Author keywords

Nickel; Nickel suicide phases; Scanning photoelectron microscopy; Silicon

Indexed keywords

COMPOSITION; ELECTRON ENERGY LEVELS; MOLECULAR ORIENTATION; NICKEL; OPTICAL RESOLVING POWER; PHOTOELECTRON SPECTROSCOPY; SILICON; SILICON COMPOUNDS; SYNCHROTRON RADIATION; TEMPERATURE;

EID: 0345073112     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00807-1     Document Type: Article
Times cited : (5)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.