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Volumn 6, Issue 1-2, 1996, Pages 41-54

Materials for high performance infrared detectors: Status and trends

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; EPITAXIAL GROWTH; FILM GROWTH; INFRARED DETECTORS; INFRARED IMAGING; MERCURY COMPOUNDS; OPTICAL PROPERTIES; PERFORMANCE; PHYSICAL PROPERTIES; RELIABILITY; THIN FILMS;

EID: 0030180620     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/0925-3467(96)00017-1     Document Type: Article
Times cited : (7)

References (124)
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    • R. Triboulet, J. Crystal Growth 86 (1988) 79; Proc. SPIE 1106 (1989) 40.
    • (1989) Proc. SPIE , vol.1106 , pp. 40
  • 26
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    • M. Schulz and L. Caldwell, Wiss. Z. Technol. Univers. Dresden 43 (1994) 44; Infrared Phys. Technol. 36 (1995) 763; Proc. SPIE 2470 (1995) 200.
    • (1995) Infrared Phys. Technol. , vol.36 , pp. 763
  • 27
    • 30244571550 scopus 로고
    • M. Schulz and L. Caldwell, Wiss. Z. Technol. Univers. Dresden 43 (1994) 44; Infrared Phys. Technol. 36 (1995) 763; Proc. SPIE 2470 (1995) 200.
    • (1995) Proc. SPIE , vol.2470 , pp. 200
  • 48
  • 98
    • 36549101477 scopus 로고
    • D.H. Chow, R.H. Miles, J.R. Soderstrom and T.C. McGill, Appl. Phys. Lett. 56 (1990) 1418; 57 (1990) 801.
    • (1990) Appl. Phys. Lett. , vol.57 , pp. 801


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.