High precision 2-D angle measurement using fringe analysis techniques

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4451, Issue , 2001, Pages 448-457

  Ge, Zongtao ^a   Saito, Takayuki ^a   Matsuda, Shinichi ^a   Takeda, Mitsuo ^b  

^a Fuji Photo Optical Co Ltd   (Japan)

^b UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

2 D angle measurement; Fourier transform method; Fringe analysis; Interferometry; Least square fitting; Phase shift method

Indexed keywords

ANGLE MEASUREMENT; COMPUTER SIMULATION; CURVE FITTING; FOURIER TRANSFORMS; INTERFEROMETERS; LEAST SQUARES APPROXIMATIONS;

FRINGE ANALYSIS; LEAST SQUARE FITTING; PHASE-SHIFT METHOD;

INTERFEROMETRY;

EID: 0035761778     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.453643     Document Type: Article

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