Operational stability of electrophosphorescent devices containing p and n doped transport layers

Applied Physics Letters

Volumn 83, Issue 19, 2003, Pages 3858-3860

  D'Andrade, Brian W ^a   Forrest, Stephen R ^a   Chwang, Anna B ^b  

^a Princeton University   (United States)

^b UNIVERSAL DISPLAY CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HOLE BLOCKING LAYERS (HBL); OPERATIONAL STABILITY;

AROMATIC COMPOUNDS; CURRENT DENSITY; DIFFERENTIAL SCANNING CALORIMETRY; DOPING (ADDITIVES); ELECTRIC POTENTIAL; FLAT PANEL DISPLAYS; GLASS TRANSITION; INDIUM COMPOUNDS; IRIDIUM; PHOSPHORESCENCE; QUENCHING; SECONDARY ION MASS SPECTROMETRY; SUBSTRATES; THERMODYNAMIC STABILITY; VACUUM;

LIGHT EMITTING DIODES;

EID: 0344514700     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1624473     Document Type: Article

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