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Volumn 79, Issue 4, 1996, Pages 1061-1065

Synthesis, characterizations, and optical properties of stacked porous thin films derived from sol-gel process

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CHARACTERIZATION; ELLIPSOMETRY; OPTICAL PROPERTIES; POROUS SILICON; REFRACTIVE INDEX; SOL-GELS; SURFACE TREATMENT; SYNTHESIS (CHEMICAL); TITANIUM OXIDES; X RAY DIFFRACTION;

EID: 0030129727     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb08548.x     Document Type: Article
Times cited : (55)

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