Towards dynamical force microscopy using optical probing of thermomechanical noise

Applied Physics Letters

Volumn 83, Issue 18, 2003, Pages 3824-3826

  Vairac, P ^a   Cretin, B ^a   Kulik, A J ^b  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC VARIABLES MEASUREMENT; BANDWIDTH; CURRENT DENSITY; ELASTIC MODULI; ELASTICITY; ELECTRIC CONTACTS; MATHEMATICAL MODELS; MECHANICAL PROPERTIES; NATURAL FREQUENCIES; NUMERICAL METHODS; THERMAL NOISE; VIBRATIONS (MECHANICAL);

DYNAMICAL FORCE MICROSCOPY; FLEXURAL VIBRATION MODE; HIGH SENSITIVITY HETERODYNE INTERFEROMETER; MICROCANTILEVER; OPTICAL PROBING; POWER SPECTRAL DENSITY; RESONANT FREQUENCY; THERMOMECHANCIAL NOISE;

MICROSCOPIC EXAMINATION;

EID: 0344066232     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1624634     Document Type: Article

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