-
1
-
-
0012618901
-
Atomic force microscopy
-
G. Bining, C. F. Quate and C. Gerber, "Atomic force microscopy", Phys. Rev. Lett. 56, pp. 930, 1986.
-
(1986)
Phys. Rev. Lett.
, vol.56
, pp. 930
-
-
Bining, G.1
Quate, C.F.2
Gerber, C.3
-
4
-
-
0000995693
-
Heterodyne interferometric laser probe to measure continuous ultrasonic displacements
-
J.P.Monchalin, "Heterodyne interferometric laser probe to measure continuous ultrasonic displacements", Rev. Scien. Instrument, 56, No.4, pp. 543, 1985.
-
(1985)
Rev. Scien. Instrument
, vol.56
, Issue.4
, pp. 543
-
-
Monchalin, J.P.1
-
6
-
-
0023962776
-
Heterodyne interferometers: Practical limitations and improvements
-
B. Cretin, W. Xie, S. Wang, D. Hauden, "Heterodyne interferometers: Practical limitations and improvements", Optics Com. 65, N° 3, pp. 157-162, 1988.
-
(1988)
Optics Com.
, vol.65
, Issue.3
, pp. 157-162
-
-
Cretin, B.1
Xie, W.2
Wang, S.3
Hauden, D.4
-
7
-
-
0022308623
-
Improved version of a polarized beam heterodyne interferometer
-
D.Royer, E.Dieulesaint, Y.Martin, "Improved version of a polarized beam heterodyne interferometer", IEEE Ultrasonics Symposium Proc., pp. 432, 1985.
-
(1985)
IEEE Ultrasonics Symposium Proc.
, pp. 432
-
-
Royer, D.1
Dieulesaint, E.2
Martin, Y.3
-
8
-
-
0030289637
-
Heterodyne laser probe using a double pass
-
P. Vairac, B. Cretin, "Heterodyne laser probe using a double pass", Optics Com. 132, pp. 19-23, 1996.
-
(1996)
Optics Com.
, vol.132
, pp. 19-23
-
-
Vairac, P.1
Cretin, B.2
-
9
-
-
84994389138
-
-
C7.7
-
B. Cretin, O. Franquet, E. Farnault, D. Hauden, J.-L. Lesne: Journal de Physique IV, C7.7, 1994.
-
(1994)
Journal de Physique IV
-
-
Cretin, B.1
Franquet, O.2
Farnault, E.3
Hauden, D.4
Lesne, J.-L.5
-
10
-
-
0000156345
-
-
P. Maivald, H.J. Butt, S.A. Gould, C.B. Prater, B. Drake, J.A. Gurley, V.B. Elings and P. Hansma, Nanotechnology, vol. 2, pp. 103, 1991.
-
(1991)
Nanotechnology
, vol.2
, pp. 103
-
-
Maivald, P.1
Butt, H.J.2
Gould, S.A.3
Prater, C.B.4
Drake, B.5
Gurley, J.A.6
Elings, V.B.7
Hansma, P.8
-
11
-
-
0000125920
-
Elastic imaging with nanoscale and atomic resolution by Ultrasonic Force Microscopy (UFM)
-
O. Kolosov, H. Ogiso, H. Tokumoto, K. Yamanaka, "Elastic imaging with nanoscale and atomic resolution by Ultrasonic Force Microscopy (UFM)", Springer series in materials sciences, Vol. 31, pp. 345-348, 1994.
-
(1994)
Springer series in materials sciences
, vol.31
, pp. 345-348
-
-
Kolosov, O.1
Ogiso, H.2
Tokumoto, H.3
Yamanaka, K.4
-
12
-
-
5544315851
-
Material'sproperties measurements: Choosing the optimal SPM configuration
-
N.A. Burnham, A.J. Kulik, G. Gremaud, P.J. Gallo, F. Ouveley, "Material'sproperties measurements: choosing the optimal SPM configuration", J. Vac. Sci. Technol. B14, pp. 794, 1996.
-
(1996)
J. Vac. Sci. Technol.
, vol.B14
, pp. 794
-
-
Burnham, N.A.1
Kulik, A.J.2
Gremaud, G.3
Gallo, P.J.4
Ouveley, F.5
-
14
-
-
0000529317
-
-
U. Rabe, K. Janser, and W. Arnold, Rev. Sci. Instrum. 67, pp. 3281, 1996.
-
(1996)
Rev. Sci. Instrum.
, vol.67
, pp. 3281
-
-
Rabe, U.1
Janser, K.2
Arnold, W.3
-
15
-
-
0041476496
-
Measurement of cantilever vibrations with a new heterodyne laser probe: Application to scanning microdeformation microscopy
-
B. Cretin, P. Vairac, "Measurement of cantilever vibrations with a new heterodyne laser probe: application to scanning microdeformation microscopy", Appl. Phys. A 66, pp.235, 1998.
-
(1998)
Appl. Phys. A
, vol.66
, pp. 235
-
-
Cretin, B.1
Vairac, P.2
-
22
-
-
36448999364
-
-
A. K. Henning, T. Hochwitz, J. Slinkman, J. Never, S. Hoffmann, P. Kaszuba and C. Daghlian, J. Appl. Phys. 77, 1888 (1995).
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 1888
-
-
Henning, A.K.1
Hochwitz, T.2
Slinkman, J.3
Never, J.4
Hoffmann, S.5
Kaszuba, P.6
Daghlian, C.7
|