|
Volumn 437, Issue 2-3, 1999, Pages 359-366
|
X-ray measurement of the subpixel structure of the XMM EPIC MOS CCD
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHARGE COUPLED DEVICES;
ELECTRODES;
PHOTONS;
RADIATION DETECTORS;
SUBPIXEL STRUCTURE;
X RAY MEASUREMENT;
X RAYS;
|
EID: 0343627855
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)00762-7 Document Type: Article |
Times cited : (8)
|
References (13)
|