Performance of the XMM EPIC MOS CCD detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3445, Issue , 1998, Pages 13-27

  Short, A D ^a   Keay, A ^a   Turner, M J L ^a  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRODES; ETCHING; MIRRORS; MONTE CARLO METHODS; MOS DEVICES; QUANTUM EFFICIENCY; SEMICONDUCTING SILICON; X RAYS;

X RAY MULTIMIRRORS (XMM);

RADIATION DETECTORS;

EID: 0032298499     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)