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Volumn 46, Issue 2, 1999, Pages 100-106

Improvement of the Position Resolution of the CCD for X-Ray Use

Author keywords

Charge cloud shape; Charge coupled device; Mesh experiment; Subpixel resolution

Indexed keywords

ELECTRIC CHARGE; MATHEMATICAL MODELS; OPTICAL RESOLVING POWER; X RAYS;

EID: 0033279682     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.757195     Document Type: Article
Times cited : (16)

References (18)
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    • New technique of the X-ray efficiency measurement of a charge-coupled device with a subpixel resolution
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    • Where are the X-ray event grades formed inside the pixel of the charge-coupled device? the behavior of the primary charge cloud inside the charge-coupled device
    • H. Tsunemi, J. Hiraga, K. Yoshita, and S. Kitamoto, "Where are the X-ray event grades formed inside the pixel of the charge-coupled device? The behavior of the primary charge cloud inside the charge-coupled device," Japan J. Appl. Phys., vol. 37, pp. 2734-2739, 1998.
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    • K. Yoshita, H. Tsunemi, K. C. Gendreau, G. Pennington, and M. W. Bautz, "Direct measurements at the sub-pixel level of the X-ray detection efficiency of the CCD on board the ASCA satellite," IEEE Trans. Nucl. Sci., vol. 45, pp. 915-920, 1998.
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    • Yoshita, K.1    Tsunemi, H.2    Gendreau, K.C.3    Pennington, G.4    Bautz, M.W.5
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.