New technique of the X-ray efficiency measurement of a charge-coupled device with a subpixel resolution

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 5 A, 1997, Pages 2906-2911

  Tsunemi, Hiroshi ^a,b   Yoshita, Kumi ^a   Kitamoto, Shunji ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Charge coupled device; Detection efficiency; Gate structure; Subpixel resolution

Indexed keywords

DETECTION EFFICIENCY; SUBPIXEL RESOLUTION; X RAY DETECTION CHARGE COUPLED DEVICE SYSTEMS;

CAMERAS; RADIATION DETECTORS; X RAYS;

CHARGE COUPLED DEVICES;

EID: 0031145561     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.2906     Document Type: Article

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